Measurement of the Dispersion of 𝝌 (3) of SiO2 and SiN Across the THz and Far-Infrared Frequency Bands

B. Zhou, M. Rasmussen, S. Zibod, S. Yan, N. K. Noori, O. Nagy, Y. Ding, S. J. Lange, K. Dolgaleva, R. W. Boyd, P. U. Jepsen, Laser & Photonics Reviews (2024).

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